Radiation damage of the x-ray CCD

Details Radiation damage of the x-ray CCD Radiation damage of the x-ray CCD

Oct 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2808..250t&link_type=abstract

Proc. SPIE Vol. 2808, p. 250-259, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, Oswald H. Siegmund; Mark A. Gummi

Astronomy and Astrophysics

Astronomy

Scientific paper

We studied the proton damage effects of the x-ray CCD. We have measured x-ray CCD performances after the irradiation of energies at 2 and 9.5 MeV, and confirmed clear degradation of charge transfer efficiency (CTE) and the energy resolution. To recover degraded CTE and the energy resolution, we tried the charge injection technique, and found the improvement of CTI and the energy resolution to be one-quarter and one-third, respectively. We also estimated the energy level of the deep trap, which causes the quantization of the dark current from the radiation-damaged pixels. The trap energy level is about 0.57 eV, or near the center of forbidden band.

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