Long Term Analysis for the BAM device

Details Long Term Analysis for the BAM device Long Term Analysis for the BAM device

Feb 2011

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2011eas....45...37b&link_type=abstract

EAS Publications Series, Volume 45, 2011, pp.37-40

Other

Scientific paper

Algorithms aimed at the evaluation of critical quantities are based on models with many parameters, which values are estimated from data. The knowledge, with high accuracy, of these values and the control of their temporal evolution are important features. In this work, we focus on the latter subject, and we show a proposed pipeline for the BAM (Basic Angle Monitoring) Long Term Analysis, aimed at the study of the calibration parameters of the BAM device and of the Basic Angle variation, searching for unwanted trends, cyclic features, or other potential unexpected behaviours.

Affiliated with

Also associated with

No associations

Rating

Long Term Analysis for the BAM device does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Long Term Analysis for the BAM device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Long Term Analysis for the BAM device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1119618