Exteme Ultraviolet Spectrophotometer: Algorithms and Calibrations

Details Exteme Ultraviolet Spectrophotometer: Algorithms and Calibrations Exteme Ultraviolet Spectrophotometer: Algorithms and Calibrations

May 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009spd....40.1712d&link_type=abstract

American Astronomical Society, SPD meeting #40, #17.12; Bulletin of the American Astronomical Society, Vol. 41, p.844

Astronomy and Astrophysics

Astronomy

Scientific paper

The Extreme ultraviolet SpectroPhotometer (ESP) is one of five instruments on the Extreme ultraviolet Variability Experiment (EVE) suite of instruments onboard the Solar Dynamics Observatory (SDO). The ESP instrument design is based on a highly stable diffraction transmission grating and is an advanced version of the Solar Extreme ultraviolet Monitor (SEM), which has been successfully observing solar irradiances onboard the Solar and Heliospheric Observatory (SOHO) since December 1995. ESP is designed to measure solar EUV irradiance in four first order channels of the diffraction grating centered around 19 nm, 25 nm, 30 nm, and 36 nm, and in a soft X-ray band from 0.1 nm to 7.0 nm in the zeroth order channel. Each channel's detector converts the photo-current into a count rate (frequency). Frequencies are integrated over 0.25 sec increments and transmitted to the EVE Science and Operations Center for data processing. An algorithm for conversion of the measured count rates into solar irradiance and ESP calibration results are described. This work was supported by the University of Colorado award 153-5979.

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