Synchrotron X-Ray Fluorescence: A New Approach for Determining Trace Element Concentrations in Individual Presolar SiC Grains

Details Synchrotron X-Ray Fluorescence: A New Approach for Determining Trace Element Concentrations in Individual Presolar SiC Grains Synchrotron X-Ray Fluorescence: A New Approach for Determining Trace Element Concentrations in Individual Presolar SiC Grains

Mar 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001lpi....32.2192k&link_type=abstract

32nd Annual Lunar and Planetary Science Conference, March 12-16, 2001, Houston, Texas, abstract no.2192

Computer Science

15

Scientific paper

Synchrotron x-ray fluorescence (SXRF) is a new non-destructive approach
for determining trace elements' concentrations in individual presolar
SiC grains. We report here on first measurements of chemical composition
of 15 individual grains by this method.

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