Computer Science
Scientific paper
Oct 1994
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2261....2h&link_type=abstract
Proc. SPIE Vol. 2261, p. 2-9, Optical System Contamination: Effects, Measurements, and Control IV, A. Peter M. Glassford; Ed.
Computer Science
Scientific paper
Contamination witness plates were flown on STS-51 as part of a NASA Extravehicular Activity (EVA) Flight Test Experiment to quantify and identify particulate contamination generated in the Orbiter crew compartment which has the potential to contaminate the Extravehicular Mobility Units (EMUs) and transfer from the EMUs to mission critical hardware during EVAs. Particles, larger than 100 microns, were found on both witness plates, indicating transfer from the EMUs during EVAs. For missions such as the Hubble Space Telescope First Servicing Mission, where contamination critical optical elements were exposed during EVAs, the potential for particulate transfer from the crew compartment to these optical elements and the Hubble Space Telescope was evaluated.
Hansen Patricia A.
Hedgeland Randy J.
Maag Carl R.
Seaman Calvin H.
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