Measuring X-ray Absorption Fine Structures of Interstellar Grains

Details Measuring X-ray Absorption Fine Structures of Interstellar Grains Measuring X-ray Absorption Fine Structures of Interstellar Grains

Sep 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004cxo..prop.1803c&link_type=abstract

Chandra Proposal ID #06910030

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Chandra Proposal Id #06910030

Scientific paper

We propose to study compositions and structures of interstellar matter using HETGS observations of the X-ray binary GX 5-1. We intend to obtain a highly resolved X-ray spectrum primarily around the Si K edge region. We will determine the structure of the Si edge abd identify X-ray Absorption Fine Structure (XAFS). Fitting the structure with recent laboratory data allows us to determine the amount of SiO2 likely bound into grains relative to absorption of atomic Si. The observations may allow us to identify XAFSs signatures from other molecular compounds. We will similarily investigate possible structures in the Mg K and S K edges as well.

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