Computer Science
Scientist
Hitachi, Ltd., Naka Works, Katsuta, Japan
Design of a High-Resolution Extreme-Ultraviolet Imaging Spectrometer with Aberration-Corrected Concave Gratings
Design of an EUV spectrometer with stigmatic image focusing using spherical varied line-space gratings
Design of spherical varied line-space gratings for a high-resolution EUV spectrometer
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