Physics – Condensed Matter – Materials Science
Scientist
Physics
Condensed Matter
Materials Science
Scientist
Detection of nano scale thin films with polarized neutron reflectometry at the presence of smooth and rough interfaces
Effect of backing thickness on determination of the phase in neutron reflectometry by variation of backing
Influences of substrate thickness on neutron specular reflection
Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by neutron reflectometry
Level Crossing Analysis of the Stock Markets
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