4. Physics
  5. Condensed Matter
  6. Materials Science

S. R. Bhattacharyya

Physics – Condensed Matter – Materials Science

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Analysis of atomic depth profiles directly extracted from Rutherford backscattering data for co-sputtered and ion irradiated Au-Ni films

Physics – Condensed Matter – Materials Science
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Energy dependent wavelength of the ion induced nanoscale ripple

Physics – Condensed Matter – Materials Science
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