Physics
Optics
Scientist
Département de Génie Physique and Regroupement Québécois sur les Matériaux de Pointe
A simple method for the determination of slowly varying refractive index profiles from in situ spectrophotometric measurements
Evidence of valence band perturbations in GaAsN/GaAs(001): A combined variable-angle spectroscopic ellipsometry and modulated photoreflectance investigation
Structural properties of silicon dioxide thin films densified by medium-energy particles
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