Computer Science
Scientist
Effect of High-Temperature Electron Irradiation in Deep Submicron MOSFETs
Impact of Irradiations Performed at Liquid Helium Temperatures on the Operation of 0.7μm CMOS Devices and Read-Out Circuits
Radiation-Induced Back Channel Leakage in 60 MeV-Proton-Irradiated 0. 10μm-CMOS Partially Depleted SOI MOSFETs
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