Statistics – Applications
Scientist
Statistics
Applications
Scientist
Raytheon TI Systems, P.O. Box 655936, MS 154, Dallas, Texas 75265
Raytheon Systems Company
Texas Instruments, Inc., Dallas
Texas Instruments, Inc.
Analysis of thin film multilayer structures by reflectance spectroscopy
Characterization of metal organic chemical vapor deposition films
Measurements of the surface recombination velocity of (Hg, Cd)Te
Optical absorption coefficient of CdZnTe
Vacancies in Hg1-xCdxTe
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